MIL-PRF-19500-512 Revision L:2015
Current
The latest, up-to-date edition.
Transistor, PNP, Silicon, Switching, Encapsulated (Through-Hole and Surface Mount) and Unencapsulated, Radiation Hardness Assurance, Device Types 2N4029 and 2N4033, Quality Levels: JAN, JANTX, JANTXV, JANS, JANHC and JANKC
05-06-2015
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Specifies the performance requirements for PNP silicon transistors for use in high speed switching and driver applications.
| DevelopmentNote |
Supersedes MIL S 19500/512 (B). (02/2000)
|
| DocumentType |
Standard
|
| Pages |
74
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| Supersedes |
This specification covers the performance requirements for PNP silicon transistors for use in high speed switching and driver applications. Four levels of product assurance (JAN, JANTX, JANTXV, and JANS) are provided for each encapsulated device type as specified in MIL-PRF-19500, and two levels of product assurance (JANHC and JANKC) for each unencapsulated device type. Provisions for radiation hardness assurance (RHA), eight radiation levels are provided for JANTXV and JANS product assurance levels. RHA level designators \"M\", \"D\", P\", \"L\", \"R\", \"F\", \"G\", and \"H\" are appended to the device prefix to identify devices, which have passed RHA requirements.
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
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