MIL-PRF-19500-554 Revision F:2015
Current
The latest, up-to-date edition.
Semiconductor Device Diode, Silicon, Schottky Barrier, Fast Recovery, Type 1N6392, JAN, JANTX, JANTXV, and JANHC
English
06-03-2015
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Specifies the performance requirements for a silicon, fast recovery, Schottky barrier semiconductor diode.
| DevelopmentNote |
Supersedes MIL S 19500/554 (02/2000)
|
| DocumentType |
Standard
|
| Pages |
15
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| Supersedes |
This specification covers the performance requirements for a silicon, fast recovery, Schottky barrier semiconductor diode. Three levels of product assurance are provided for each encapsulated device (JAN, JANTX, and JANTXV). One level of product assurance (JANHC) is provided for each unencapsulated device type.
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
Access your standards online with a subscription
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.