MIL-PRF-19500-586 Revision M:2017
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY BARRIER, ENCAPSULATED (AXIAL LEADED AND SURFACE MOUNT) AND UNENCAPSULATED, TYPES 1N5817-1, 1N5819-1, AND 1N6761-1, QUALITY LEVELS JAN, JANTX, JANTXV, JANS, JANHC, AND JANKC
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PDF
Language(s)
English
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1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Describes the performance requirements for silicon, Schottky barrier diodes.
| Committee |
FSC 5961
|
| DevelopmentNote |
Supersedes MIL S 19500/586 (B). (02/2000)
|
| DocumentType |
Standard
|
| Pages |
24
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| MIL-PRF-19500 Revision P:2010 | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
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