MIL-PRF-19500-610 Revision F:2014
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Semiconductor Device, Diode, Silicon, Rectifier, Schottky Barrier, Encapsulated (Axial Leaded and Surface Mount) and Unencapsulated, Types 1N6677-1 and 1N6677UR-1, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, and JANKC
English
16-01-2014
20-04-2021
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Describes the performance requirements for silicon, Schottky barrier diodes.
| DevelopmentNote |
Supersedes MIL S 19500/610. (02/2000)
|
| DocumentType |
Standard
|
| Pages |
19
|
| PublisherName |
US Military Specs/Standards/Handbooks
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| Status |
Superseded
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| SupersededBy | |
| Supersedes |
This specification covers the performance requirements for silicon, Schottky barrier rectifier diodes. Four levels of product assurance (JAN, JANTX, JANTXV, and JANS) are provided for each encapsulated device types as specified in MIL-PRF-19500, and two levels of product assurance (JANHC and JANKC) for each unencapsulated device type die.
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
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