MIL-PRF-19500-631 Revision B:2004
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
View Superseded by
Transistor, Field Effect, N-Channel Silicon, Radiation Hardened (Total Dose and Single Event Effects), Types 2N7395, 2N7396, 2N7397, and 2N7398, Quality Levels JANSD and JANSR (NO S/S DOCUMENT)
09-03-2004
28-08-2025
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Covers performance requirements for a N-channel, enhancement-mode, MOSFET, radiation hardened, power transistor intended for use in high density power switching applications.
| DevelopmentNote |
B NOTICE 1 - Notice of Validation. (07/2011) B NOTICE 2 - Notice of Validation. (05/2016)
|
| DocumentType |
Standard
|
| Pages |
28
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Withdrawn
|
| SupersededBy |
This specification covers the performance requirements for a N-channel, enhancement-mode, MOSFET, radiation hardened (total dose and single event characterization only), power transistors. One level of product assurance (JANS)is provided for each device type as specified in MIL-PRF-19500.
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
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