MIL-PRF-19500-632 Revision C:2014
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
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Transistor, Field Effect, N-Channel Silicon, Radiation Hardened (Total Dose and Single Even Effects), Types 2N7399, 2N7400, 2N7401, and 2N7402, Flange Mount Package, Quality Levels JANSD and JANSR (No S/S Document)
English
02-05-2014
28-08-2025
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Describes the performance requirements for an N-channel, enhancement-mode, MOSFET, radiation hardened (total dose and single event characterization), power transistor.
| DocumentType |
Standard
|
| Pages |
25
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Withdrawn
|
| SupersededBy |
This specification covers the performance requirements for an N-channel, enhancement-mode, MOSFET, radiation hardened (total dose and single event characterization only), power transistor. One level of product assurance (JANS)is provided for each device type as specified in MIL-PRF-19500.
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
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