MIL-PRF-19500-657 Revision B:2011
Current
The latest, up-to-date edition.
Transistor, Silicon, N and P-Channel, Field Effect, Radiation Hardened, Unencapsulated Die, Various Types, Quality Levels JANHC and JANKC
26-01-2011
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Describes the performance requirements for N and P-channel, enhancement-mode, MOSFET, radiation hardened, power transistor die.
| DevelopmentNote |
B NOTICE 1 - Notice of Validation. (12/2015)
|
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
This specification covers the performance requirements for N and P-channel, enhancement-mode, MOSFET, radiation hardened, power transistor die. Two levels of product assurance (JANHC and JANKC) are provided for each device type as specified in MIL-PRF-19500.
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
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