MIL-PRF-19500-657 Revision B:2011
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICE, FIELD EFFECT, RADIATION HARDENED, TRANSISTOR DIE, N AND P-CHANNEL, SILICON VARIOUS TYPES JANHC AND JANKC
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Describes the performance requirements for N and P-channel, enhancement-mode, MOSFET, radiation hardened, power transistor die.
Committee |
FSC 5961
|
DevelopmentNote |
B NOTICE 1 - Notice of Validation. (12/2015)
|
DocumentType |
Standard
|
Pages |
16
|
PublisherName |
US Military Specs/Standards/Handbooks
|
Status |
Current
|
MIL-PRF-19500 Revision P:2010 | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.