MIL-PRF-19500-666 Base Document:1999
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Semiconductor Device, Field Effect Radiation Hardened (Total Dose and Single Event Effects) Transistor, P-Channel Silicon Type 2N7454U1, 2N7455U1 JANSD, R (NO S/S DOCUMENT)
03-08-1999
09-12-2004
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Describes the performance requirements for a P-Channel, enhancement-mode, MOSFET, radiation hardened (Total Dose and Single Event characterization), power transistor.
| DevelopmentNote |
NOTICE 1 - Notice of Cancellation without replacement. (12/2004)
|
| DocumentType |
Standard
|
| Pages |
22
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Withdrawn
|
This specification covers the performance requirements for a P-Channel, enhancement-mode, MOSFET, radiation hardended (Total Dose and Single Event Effects) Transistor, P-Channel Silicon Type 2N7454U1, 2N7455U1 JANSD, R
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
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