MIL-PRF-19500-759 Revision A:2012
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) DUAL TRANSISTOR, N-CHANNEL AND P-CHANNEL, LOGIC-LEVEL SILICON TYPES 2N7632UD, JANTXVR, F, AND JANSR, F
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1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Describes the performance requirements for dual N-channel and P-channel, enhancement-mode, low-threshold logic level, MOSFET, radiation hardened (total dose and single event effects (SEE)), power transistor.
| Committee |
FSC 5961
|
| DevelopmentNote |
A NOTICE 1 - Notice of Validation. (11/2016) NEW CHILD NOT 2 2021 IS NOW ADDED.
|
| DocumentType |
Standard
|
| Pages |
23
|
| ProductNote |
NEW CHILD NOT 2 2021 IS NOW ADDED.
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| MIL-PRF-19500 Revision P:2010 | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
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