MIL-PRF-39006 Revision G:2006
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
CAPACITOR, FIXED, ELECTROLYTIC (NONSOLID ELECTROLYTE), TANTALUM, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
07-05-2021
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
APPENDIX A - PROCEDURE FOR QUALIFICATION INSPECTION
Includes tantalum, electrolytic (nonsolid electrolyte), fixed capacitors (polarized and nonpolarized), hermetically sealed in metal cases. Capacitors covered by this specification have reliability established for failure rate levels (FRL) ranging from 2.0 (or 1.0) percent to 0.001 percent per 1,000 hours in accordance with MIL-STD-690.
Committee |
FSC 5910
|
DevelopmentNote |
Supersedes MIL C 39006 (D). (04/2003) Inactive for New Design. (12/2006)
|
DocumentType |
Standard
|
Pages |
150
|
PublisherName |
US Military Specs/Standards/Handbooks
|
Status |
Superseded
|
Supersedes |
DSCC 93026 : V | CAPACITOR, FIXED, ELECTROLYTIC (NONSOLID ELECTROLYTE), TANTALUM (POLARIZED, SINTERED SLUG) |
MIL-STD-1580 Revision B:2003 | DESTRUCTIVE PHYSICAL ANALYSIS FOR ELECTRONIC, ELECTROMAGNETIC, AND ELECTROMECHANICAL PARTS |
MIL-PRF-39006-21 Revision C:2010 | CAPACITORS, FIXED, ELECTROLYTIC (NONSOLID ELECTROLYTE), TANTALUM, (POLARIZED, SINTERED SLUG) (EXTENDED RANGE), 85 DEGREES C (VOLTAGE DERATED TO 125 DEGREES C), ESTABLISHED RELIABILITY, STYLE CLR69 |
DSCC 06013C:2023 | CAPACITOR, FIXED, ELECTROLYTIC (NONSOLID ELECTROLYTE), TANTALUM |
DSCC 06016C:2023 | CAPACITOR, FIXED, ELECTROLYTIC (NONSOLID ELECTROLYTE), TANTALUM |
DSCC 10004J:2023 | CAPACITOR, FIXED, ELECTROLYTIC (NONSOLID ELECTROLYTE), TANTALUM (POLARIZED SLUG) |
MIL-DTL-917 Revision F:2014 | ELECTRIC POWER EQUIPMENT, BASIC REQUIREMENTS FOR |
MIL-DTL-3965 Revision H:2004 | CAPACITOR, FIXED ELECTROLYTIC (NONSOLID ELECTROLYTE), TANTALUM, GENERAL SPECIFICATION FOR |
MIL STD 11991 : A | GENERAL STANDARD FOR PARTS, MATERIALS, AND PROCESSES |
DSCC 10004 : G | CAPACITOR, FIXED, ELECTROLYTIC (NONSOLID ELECTROLYTE), TANTALUM (POLARIZED SLUG) |
DSCC 13030 : B | CAPACITOR, FIXED, POLYMER TANTALUM, AXIAL LEADED, HERMETICALLY SEALED, STANDARD AND HIGH RELIABILITY |
MIL-PRF-39006-9 Revision G:2010 | CAPACITORS, FIXED, ELECTROLYTIC (NONSOLID ELECTROLYTE), TANTALUM, (POLARIZED, SINTERED SLUG), 85 DEGREES C (VOLTAGE DERATED TO 125 DEGREES C), ESTABLISHED RELIABILITY, STYLE CLR65 |
MIL-PRF-39006-25 Revision E:2012 | Capacitor, Fixed, Electrolytic (Nonsolid Electrolyte), Tantalum (Polarized, Sintered Slug), Extended Range, +85 Degrees C (Voltage Derated to +125 Degrees C), Established Reliability, Style CLR81 |
MIL-PRF-39006-33 Revision A:2012 | CAPACITORS, FIXED, ELECTROLYTIC (NONSOLID ELECTROLYTE), TANTALUM, (POLARIZED, SINTERED SLUG), (EXTENDED RANGE), 85 DEGREES C (VOLTAGE DERATED TO 125 DEGREES C), ESTABLISHED RELIABILITY, STYLE CLR93 |
MIL C 3965 : F | CAPACITOR, FIXED ELECTROLYTIC (NONSOLID ELECTROLYTE), TANTALUM, GENERAL SPECIFICATION FOR |
MIL-PRF-39006-31 Revision C:2011 | Capacitor, Fixed, Electrolytic (Nonsolid Electrolyte), Tantalum (Polarized, Sintered Slug), Extended Range, +85 Degrees C (Voltage Derated to +125 Degrees C), Established Reliability, Style CLR91 |
NASA JSC 08080-2 : 2015 | JSC DESIGN AND PROCEDURAL STANDARDS |
NASA MSFC STD 3012 : 2012 | ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL (EEE) PARTS MANAGEMENT AND CONTROL REQUIREMENTS FOR MSFC SPACE FLIGHT HARDWARE |
MIL-PRF-39006-30 Revision C:2011 | Capacitor, Fixed, Electrolytic (Nonsolid Electrolyte), Tantalum (Polarized, Sintered Slug), +85 Degrees C (Voltage Derated to +125 Degrees C), Established Reliability, Style CLR90 |
DSCC 06013 : B | CAPACITORS, FIXED, ELECTROLYTIC (NONSOLID ELECTROLYTE), TANTALUM |
DSCC 04022 : A | CAPACITORS, FIXED ELECTROLYTIC (NONSOLID ELECTROLYTE), TANTALUM, (POLARIZED, SINTERED SLUG) 85 DEGREE C (VOLTAGE DERATED TO 125 DEGREE C |
DSCC 06015 : B | CAPACITORS, FIXED, ELECTROLYTIC (NONSOLID ELECTROLYTE), TANTALUM |
DSCC 06016 : B | CAPACITORS, FIXED, ELECTROLYTIC (NONSOLID ELECTROLYTE), TANTALUM |
MIL-HDBK-198 Revision B:2012 | CAPACITORS, SELECTION AND USE OF |
MIL-PRF-39006-22 Revision J:2012 | Capacitor, Fixed, Electrolytic (Nonsolid Electrolyte), Tantalum (Polarized, Sintered Slug), +85 Degrees C (Voltage Derated to +125 Degrees C), Established Reliability, Style CLR79 |
DSCC 06014 : B | CAPACITORS, FIXED, ELECTROLYTIC (NONSOLID ELECTROLYTE), TANTALUM |
DSCC 13017 : D | CAPACITOR, FIXED, ELECTROLYTIC (NONSOLID ELECTROLYTE), TANTALUM (POLARIZED SLUG) |
DSCC 15005 : B | CAPACITOR, FIXED, ELECTROLYTIC (NONSOLID ELECTROLYTE), TANTALUM (POLARIZED SLUG), EXTENDED CAPACITANCE |
MIL-STD-202-211 Base Document:2015 | METHOD 211, TERMINAL STRENGTH |
MIL-STD-202-302 Base Document:2015 | Method 302, Insulation Resistance |
MIL-STD-810 Revision G:2008 | ENVIRONMENTAL ENGINEERING CONSIDERATIONS AND LABORATORY TESTS |
MIL-STD-202-210 Base Document:2015 | Method 210, Resistance to Soldering Heat |
MIL-STD-1276 Revision H:2013 | Leads for Electronic Component Parts |
MIL-STD-202-305 Base Document:2015 | Method 305, Capacitance |
MIL-STD-202-101 Base Document:2015 | Method 101, Salt Atmosphere (Corrosion) |
MIL-STD-202-107 Base Document:2015 | Method 107, Thermal Shock |
MIL-STD-202-106 Base Document:2015 | Method 106, Moisture Resistance |
MIL-STD-202-301 Base Document:2015 | Method 301, Dielectric Withstanding Voltage |
MIL-STD-202-215 Base Document:2015 | METHOD 215, RESISTANCE TO SOLVENTS |
MIL-STD-790 Revision G:2011 | ESTABLISHED RELIABILITY AND HIGH RELIABILITY QUALIFIED PRODUCTS LIST (QPL) SYSTEMS FOR ELECTRICAL, ELECTRONIC, AND FIBER OPTIC PARTS SPECIFICATIONS |
SAE AMS DTL 23053 : 1999 | INSULATION SLEEVING, ELECTRICAL, HEAT SHRINKABLE, GENERAL SPECIFICATION FOR |
MIL-STD-202-108 Base Document:2015 | Method 108, Life (at Elevated Ambient Temperature) |
MIL-STD-202-105 Base Document:2015 | Method 105, Barometric Pressure (Reduced) |
MIL-STD-202-208 Base Document:2015 | Method 208, Solderability |
MIL-STD-202 Revision H:2015 | ELECTRONIC AND ELECTRICAL COMPONENT PARTS |
MIL-STD-1285 Revision D:2004 | MARKING OF ELECTRICAL AND ELECTRONIC PARTS |
MIL-STD-202-214 Base Document:2015 | Method 214, Random Vibration |
MIL-STD-690 Revision D:2005 | Failure Rate (FR) Sampling Plans and Procedures |
MIL-STD-202-204 Base Document:2015 | Method 204, Vibration, High Frequency |
MIL-STD-202-112 Base Document:2015 | METHOD 112, SEAL |
MIL-STD-202-213 Base Document:2015 | Method 213, Shock (Specified Pulse) |
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