MIL S 19500/115 : H
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
SEMICONDUCTOR DEVICE, DIODE, SILICON, VOLTAGE REGULATOR TYPES 1N3821A THROUGH 1N3828A AND 1N3016B THROUGH 1N3051, TX AND TXV
10-10-1997
English
Details have been submitted to and have passed the special process-conditioning, testing, and screening tests specified herein. The prefix "TXV" refers to those which have been submitted to and have passed the internal visual inspection also specified.
Committee |
FSC 5961
|
DocumentType |
Standard
|
Pages |
22
|
PublisherName |
US Military Specs/Standards/Handbooks
|
Status |
Superseded
|
SupersededBy | |
Supersedes |
MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
MIL S 19500 : J | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.