MIL S 19500/435 : D
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
SEMICONDUCTOR DEVICE, DIODE, SILICON, LOW-NOISE VOLTAGE REGULATOR TYPES 1N4099-1, 1N4099C-1, 1N4099D-1 THROUGH 1N4135-1, 1N4135C-1, 1N4135D-1, 1N4614-1, 1N4614C-1, 1N4614D-1 THROUGH 1N4627-1, 1N4627C-1, 1N4627D-1, 1N4099UR-1,1N4099CUR-1, 1N4099DUR-1 THROUGH 1N4135UR-1, 1N4135CUR-1, 1N4135DUR-1, 1N4614UR-1, 1N4614CUR-1, 1N4614DUR-1 THRU 1N4627UR-1, 1N4627CUR-1
26-01-2000
English
Important note : Users cannot be edited or removed once added to your Multi user PDF.Specifies 500 milliwatt, silicon, low-noise voltage regulator diodes with voltage tolerances of 5%, 2% and 1%. 4 levels of product assurance are provided for each encapsulated device type and two levels for each unencapsulated device type.
| Committee |
FSC 5961
|
| DocumentType |
Standard
|
| Pages |
20
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Superseded
|
| SupersededBy |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
| MIL S 19500 : J | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
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