MIL-S-19500-517 Base Document:1977
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
SEMICONDUCTOR DEVICE, SILICON, DIODE ARRAY, TYPE 1N6101 JAN, JANTX, AND JANTXV
Available format(s)
PDF
Superseded date
23-07-2013
Superseded by
Language(s)
English
Publisher
Specifies silicon, diode array. "TX" used on devices passing special process-conditioning, screening and testing. "TXV" used on devices which have passed internal visual inspection
| Committee |
FSC 5961
|
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Superseded
|
| SupersededBy |
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
| MIL S 19500 : J | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| MIL-STD-202 Revision H:2015 | ELECTRONIC AND ELECTRICAL COMPONENT PARTS |
Important note : Users cannot be edited or removed once added to your Multi user PDF.Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.