MIL S 19500/522 : 0
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, HIGH-FREQUENCY DEVICE TYPES - JAN 2N6603 & TXV 2N6603, JAN 2N6604 & TXV 2N6604
Available format(s)
PDF
Superseded date
30-07-1999
Superseded by
Language(s)
English
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.Specifies NPN, silicon, Microwave transistors. "JAN" used on devices passing Precap Visual and Bond Strength testing. "TXV" used on devices passing specified inspection
| DocumentType |
Standard
|
| Pages |
28
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Superseded
|
| SupersededBy |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
| MIL S 19500 : J | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| MIL-STD-202 Revision H:2015 | ELECTRONIC AND ELECTRICAL COMPONENT PARTS |
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