MIL-STD-750-1 Revision A Change 3 (all previous changes incorporated):2019
Current
The latest, up-to-date edition.
Environmental Test Methods for Semiconductor Devices Part 1: Test Methods 1000 Through 1999
English
15-11-2019
Important note : Users cannot be edited or removed once added to your Multi user PDF.Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations.
| DocumentType |
Standard
|
| Pages |
177
|
| ProductNote |
THIS STANDARD ALSO REFERS TO ASTM 51275
|
| PublisherName |
US Military Specs/Standards/Handbooks
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| Status |
Current
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| Supersedes |
Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this test method standard, the term \"devices\" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.
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