MIL-STD-750/3:2012/CHANGE 1:2019
Current
Current
The latest, up-to-date edition.
Transistor Electrical Test Methods for Semiconductor Devices Part 3: Test Methods 3000 Through 3999
Available format(s)
PDF
Language(s)
English
Published date
09-12-2019
Publisher
Part 3 of this test method standard establishes uniform test methods for the electrical testing of semiconductor transistors to determine resistance to deleterious effects of natural elements and conditions surrounding military operations.
DocumentType |
Test Method
|
Pages |
345
|
PublisherName |
US Military Specs/Standards/Handbooks
|
Status |
Current
|
Supersedes |
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