MIL-STD-750-4 Change 3 (all previous changes incorporated):2019
Current
The latest, up-to-date edition.
Diode Electrical Test Methods for Semiconductor Devices Part 4: Test Methods 4000 Through 4999
English
30-12-2019
Important note : Users cannot be edited or removed once added to your Multi user PDF.| CommentClosesDate |
22-06-2020
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| DocumentType |
Standard
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| Pages |
354
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| PublisherName |
US Military Specs/Standards/Handbooks
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| Status |
Current
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| Supersedes |
Part 4 of this test method standard establishes uniform test methods for the basic electrical testing of semiconductor diodes to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term \"devices\" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts.
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