MIL-STD-883-2 Change 1 (change incorporated):2022
Current
The latest, up-to-date edition.
Mechanical Test Methods for Microcircuits Part 2: Test Methods 2000-2999
English
12-01-2022
Part 2 of this test method standard establishes uniform test methods for the mechanical testing to determine resistance to deleterious effects of natural elements and conditions surrounding military operations.
| DocumentType |
Standard
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| Pages |
393
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| ProductNote |
This standard also refers to SAE AMS-STD-595/15102, SAE AMS-STD-595/25102,ISO /ASTM 51275,ISO 17025,IPC J-STD-004,IPC J-STD-005 ,IPC J-STD-006 ,IPC J-STD-033,JEDEC Standard 12,JEDEC Standard 12-1 ,JEDEC Standard 12-2,JEDEC Standard 12-3.
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| PublisherName |
US Military Specs/Standards/Handbooks
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| Status |
Current
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| Supersedes |
Part 2 of this test method standard establishes uniform test methods for the mechanical testing to
determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term \"devices\" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices.
| DSCC 94672C:2023 | MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON |
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