MIL-STD-883-4 Base Document:2019
Current
Current
The latest, up-to-date edition.
DEPARTMENT OF DEFENSE TEST METHOD STANDARD ELECTRICAL TESTS (LINEAR) FOR MICROCIRCUITS PART 4: TEST METHODS 4000-4999
Available format(s)
PDF
Language(s)
English
Published date
16-09-2019
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.Part 3 of this test method standard establishes uniform test methods for the electrical testing (digital) to determine resistance to deleterious effects of natural elements and conditions surrounding military operations.
| DocumentType |
Test Method
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| Pages |
43
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| ProductNote |
This standard is also refers to:-MIL-PRF-35835,IPC J-STD-004,IPC J-STD-005,IPC J-STD-006,IPC J-STD-033,IPC-T-50,SAE AMS-STD-595/15102,SAE AMS-STD-595/25102.
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| PublisherName |
US Military Specs/Standards/Handbooks
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| Status |
Current
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| Supersedes |
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