NASA JSC HDBK 07-001 : 2012
Current
The latest, up-to-date edition.
HIGH ENERGY/LET RADIATION EEE PARTS CERTIFICATION HANDBOOK
Hardcopy , PDF
English
22-03-2012
Important note : Users cannot be edited or removed once added to your Multi user PDF.
1.0 SCOPE
2.0 REFERENCES
3.0 ACRONYMS, TERMS, AND DEFINITIONS
4.0 SPACE RADIATION ENVIRONMENT
5.0 GENERAL DESIGN CONSIDERATIONS
6.0 POTENTIAL EFFECTS OF RADIATION ON ELECTRONICS
7.0 FURTHER CONSIDERATIONS
7.0 FURTHER CONSIDERATIONS
8.0 NSRL FACILITY AND TESTING CAPABILITIES
9.0 PART RADIATION CHARACTERIZATION FROM VDBP
10.0 POTENTIAL ISSUES
11.0 VDBP GENERIC RUN PROCEDURE
12.0 JSC REAL TIME ANALYSIS SOFTWARE
13.0 SUMMARY
APPENDIX A - ACRONYM LIST
APPENDIX B - INFORMATIVE REFERENCES
Specifies an overview of the VDBP method and to provide test procedure guidelines to the user who chooses to implement this method over traditional heavy ion methods.
| DevelopmentNote |
Expiration Date: 22-03-2017. (07/2012)
|
| DocumentType |
Standard
|
| Pages |
27
|
| PublisherName |
National Aeronautics and Space Administration
|
| Status |
Current
|
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
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