NBN EN 140401-801 : 2007 AMD 1 2014

1 Characteristics and ratings
  1.1 Dimensions and ratings
  1.2 Derating curve
  1.3 Resistance range and tolerance on rated resistance
       1.3.1 Version A
       1.3.2 Version E
  1.4 Variation of resistance with temperature and
       temperature rise
  1.5 Climatic categories
  1.6 Limits for change of resistance at tests
  1.7 Non-linear properties
  1.8 Tests related to soldering
       1.8.1 Severities for solderability testing
       1.8.2 Severities for testing resistance to soldering heat
  1.9 Marking, packaging and ordering designation
       1.9.1 Marking of the component
       1.9.2 Taping
       1.9.3 Marking of the packaging
       1.9.4 Ordering information
  1.10 Additional information (not for inspection purpose)
       1.10.1 Storage
       1.10.2 Mounting
       1.10.3 Soldering process
       1.10.4 Conductive gluing
       1.10.5 Use of cleaning solvents
       1.10.6 Pulse load capability
       1.10.7 Variation of resistance value (drift) for operating
               times up to 200000 h
       1.10.8 Dissipation notes
       1.10.9 Current noise
       1.10.10 Temperature range extension
2 Quality assessment procedures
  2.1 General
       2.1.1 Zero defect approach
       2.1.2 100%-test
       2.1.3 0 Ohm Resistor
       2.1.4 Certificate of Conformity (CoC)
       2.1.5 Certified test records
       2.1.6 Failure rate level
  2.2 Qualification approval
       2.2.1 Version A
       2.2.2 Version E
  2.3 Quality conformance inspection
       2.3.1 Qualification approval according to QC 001002-3,
               Clause 3
       2.3.2 Technology approval according to QC 001002-3,
               Clause 6
       2.3.3 Non-conforming items
Annex A (normative) Fixed sample size qualification approval and
        quality conformance inspection test schedule for fixed low
        power surface mount (SMD) resistors
Annex B (informative) Letter symbols and abbreviations
Bibliography