
NBN EN 60269-4 : 2010 AMD 1 2013
Current
The latest, up-to-date edition.

LOW-VOLTAGE FUSES - PART 4: SUPPLEMENTARY REQUIREMENTS FOR FUSE-LINKS FOR THE PROTECTION OF SEMICONDUCTOR DEVICES
12-01-2013
INTRODUCTION
1 General
1.1 Scope
1.2 Object
2 Terms and definitions
2.2 General terms
3 Conditions for operation in service
3.4 Voltage
3.4.1 Rated voltage
3.4.2 Applied voltage in service
3.5 Current
3.6 Frequency, power factor and time constant
3.6.1 Frequency
3.6.3 Time constant (tau)
3.10 Temperature inside an enclosure
4 Classification
5 Characteristics of fuses
5.1 Summary of characteristics
5.1.2 Fuse-links
5.2 Rated voltage
5.4 Rated frequency
5.5 Rated power dissipation of the fuse-link
5.6 Limits of time-current characteristics
5.6.1 Time-current characteristics, time-current
zones
5.6.2 Conventional times and currents
5.6.3 Gates
5.6.4 Overload curves
5.7.1 Breaking range and utilization category
5.7.2 Rated breaking capacity
5.8 Cut-off current and I[2]t characteristics
5.8.1 Cut-off current characteristics
5.8.2 I[2]t characteristics
5.9 Arc voltage characteristics
6 Markings
6.2 Markings on fuse-links
7 Standard conditions for construction
7.3 Temperature rise and power dissipation of the
fuse-link
7.4 Operation
7.5 Breaking capacity
7.7 I[2]t characteristics
7.14 Arc voltage characteristics
7.15 Special operating conditions
8 Tests
8.1 General
8.1.4 Arrangement of the fuse-link
8.1.5 Testing of fuse-links
8.3 Verification of temperature rise limits and power
dissipation
8.3.1 Arrangement of the fuse-link
8.3.3 and 8.3.4.2 Measurement of power dissipation
of the fuse-link
8.3.5 Acceptability of test results
8.4 Verification of operation
8.4.1 Arrangement of fuse-link
8.4.3 Test method and acceptability of test results
8.5 Verification of the breaking capacity
8.5.1 Arrangement of the fuse
8.5.5 Test method
8.5.8 Acceptability of test results
8.6 Verification of the cut-off current characteristic
8.6.1 Test method
8.6.2 Acceptability of test results
8.7 Verification of the I[2]t characteristics and
over-current discrimination
8.7.1 Test method
8.7.2 Acceptability of test results
8.7.3 Verification of compliance for "gG" and "gM"
fuse-links
8.7.4 Verification of overcurrent discrimination
8.7.5 Verification of arc voltage characteristics
and acceptability of test results
Annex A (informative) Guide for the coordination of
fuse-links with semiconductor devices
Annex B (normative) Survey on information to be
supplied by the manufacturer in his
literature (catalogue) for a fuse designed
for the protection of semiconductor devices
Annex C (normative) Examples of standardized fuse-links
for the protection of semiconductor devices
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Applies to fuse-links for application in equipment containing semiconductor devices for circuits of nominal voltages up to 1000 V a.c. or 1500 V d.c.. It establish the characteristics of semiconductor fuse-links in such a way that they can be replaced by other fuse-links having the same characteristics, provided that their dimensions are identical.
DevelopmentNote |
Supersedes NBN C 63 269-4 (10/2003) Supersedes NBN EN 60269 4-1. (07/2007)
|
DocumentType |
Standard
|
PublisherName |
Belgian Standards
|
Status |
Current
|
Supersedes |
Standards | Relationship |
UNE-EN 60269-4:2011 | Identical |
DIN EN 60269-4 : 2017 | Identical |
BS EN 60269-4 : 2009 | Identical |
EN 60269-4:2009/A2:2016 | Identical |
IEC 60269-4:2009+AMD1:2012+AMD2:2016 CSV | Identical |
I.S. EN 60269-4:2009 | Identical |
SN EN 60269-4 : 2009 | Identical |
NF EN 60269-4 : 2010 AMD 2 2017 | Identical |
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