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NBN EN 60444-2 : 1997
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The latest, up-to-date edition.
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METING VAN DE PARAMETERS VAN KWARTSKRISTALLEN DOOR MIDDEL VAN FASENULTECHNIEK IN EEN PI-NETWERK - DEEL 3 : BASISMETHODE VOOR HET METEN VAN TWEE-POORT PARAMETERS VAN KWARTSKRISTALLEN TOT 200 MHZ DOOR FASEVERGELIJKING EN EEN PI-NETWORK MET COMPENSATIE VAN DE PARALLELCAPACITEIT
12-01-2013
Committees responsible
National foreword
Method
1 Scope
2 Principle of measurement
3 Measuring circuit
4 Method of measurement
5 Measurement errors
6 Other measuring methods
Appendix
A
Figures
1 Equivalent circuit of a quartz crystal unit
2 Measuring circuit
3 Phase and impedance characteristics of a quartz crystal
unit in the vicinity of resonance
4 Deviation of C1 as a function of Rr for various error
conditions
5 Deviation of C1 as a function of measured phase angle error
and different phase angles
6 The effect of parallel capacitance CO on the measurement
accuracy C1 versus measured phase angle
Annex ZA (normative) Normative references to international
publications with their corresponding European publications
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