NBN EN 60444-8 : 2003
Current
The latest, up-to-date edition.
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS
12-01-2013
INTRODUCTION
1 Scope
2 Normative references
3 General issue
4 Leadless surface mounted quartz crystal units
4.1 Enclosure
4.2 Overtone and frequency range
5 Specifications of measurement method, test fixture
5.1 Specifications of measurement method
5.2 Specifications of test fixture
6 Calibration of measurement system and C[L] adapter
board
6.1 Calibration of measurement system
6.2 Calibration of C[L] adapter board
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Bibliography
Specifies the test fixture that allows the accurate measurement of resonance frequency, resonance resistance, and equivalent electrical circuit parameters of a leadless surface mounted quartz crystal units using zero phase technique as specified in IEC 60444-4 and IEC 60444-5.
| DocumentType |
Standard
|
| PublisherName |
Belgian Standards
|
| Status |
Current
|
| Standards | Relationship |
| BS EN 60444-8:2017 | Identical |
| EN 60444-8:2017 | Identical |
| DIN EN 60444-8:2004-03 | Identical |
| I.S. EN 60444-8:2017 | Identical |
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