NBN EN 60749-27 : 2007 AMD 1 2012
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)
12-01-2013
1 Scope
2 Normative references
3 Terms and definitions
4 Equipment
4.1 MM ESD waveform generator
4.2 Waveform verification equipment
5 MM current waveform requirements
5.1 General
5.2 Waveform qualification and verification
6 Device specific evaluation considerations
6.1 Sample size and test conditions
6.2 Worst-case pin or standard qualification board
7 Classification procedure
7.1 Device requirements
7.2 Device selection
7.3 Device characterization
7.4 Device stress levels
7.5 Pin combinations
7.6 Order of test
8 Failure criteria
9 Classification criteria
10 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding
European publications
Describes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD).
| DocumentType |
Standard
|
| PublisherName |
Belgian Standards
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-27:2013-04 | Identical |
| EN 60749-27:2006/A1:2012 | Identical |
| I.S. EN 60749-27:2006 | Identical |
| BS EN 60749-27 : 2006 | Identical |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.