NBN EN 60749-32 : 2004 AMD 1 2010
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED)
Published date
12-01-2013
Publisher
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Foreword
INTRODUCTION
1 Scope and object
2 Normative references
3 Test procedure
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to external heating.
| DevelopmentNote |
Supersedes NBN EN 60749. (04/2004)
|
| DocumentType |
Standard
|
| PublisherName |
Belgian Standards
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-32:2011-01 | Identical |
| UNE-EN 60749-32:2004 | Identical |
| BS EN 60749-32 : 2003 | Identical |
| EN 60749-32:2003/A1:2010 | Identical |
| I.S. EN 60749-32:2003 | Identical |
Summarise
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