NBN EN 61967-2 : 2007
Current
The latest, up-to-date edition.
INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 2: MEASUREMENT OF RADIATED EMISSIONS - TEM CELL AND WIDEBAND TEM CELL METHOD
12-01-2013
Foreword
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
5.1 General
5.2 Supply voltage
5.3 Frequency range
6 Test equipment
6.1 General
6.2 Shielding
6.3 RF measuring instrument
6.4 Preamplifier
6.5 TEM cell
6.6 Wideband TEM/GTEM cell
6.7 50-Ohm termination
6.8 System gain
7 Test set-up
7.1 General
7.2 Test configuration
7.3 Test PCB
8 Test procedure
8.1 General
8.2 Ambient measurement
8.3 DUT operational check
8.4 DUT emissions measurement
9 Test report
9.1 General
9.2 Measurement conditions
10 IC emissions reference levels
Annex A (informative) Example calibration & set-up
verification sheet
Annex B (informative) TEM cell and wideband TEM cell
descriptions
B.1 TEM cell
B.2 Wideband GTEM cell
Annex C (informative) Calculation of dipole moment
from measured data
C.1 General
C.2 Dipole moment calculation
Annex D (informative) Specification of emissions data
D.1 General
D.2 Specification of emission levels
D.3 Presentation of results
D.4 Examples
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Bibliography
Describes a method for measuring the electromagnetic radiation from an integrated circuit (IC).
DocumentType |
Standard
|
PublisherName |
Belgian Standards
|
Status |
Current
|
Standards | Relationship |
DIN EN 61967-2:2006-03 | Identical |
EN 61967-2:2005 | Identical |
I.S. EN 61967-2:2005 | Identical |
BS EN 61967-2:2005 | Identical |
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