NEMA CB 4 : 1989

Withdrawn

Withdrawn A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

SEMICONDUCTOR GRAPHITE

Available format(s):

Withdrawn date: 12-04-2000

Language(s):

Published date: 12-01-2013

Publisher: National Electrical Manufacturers Association

Table of Contents - (Show below) - (Hide below)

Foreword
Scope
1 Referenced standards and definitions
     Referenced standards
     Definitions
2 Graphite properties
     Classification of grain size
     Classification of purity
     Procedures for material testing
3 General
     Handling of purified graphite
     Dust removal
     Outgassing
     Oxidation
     Purification

Abstract - (Show below) - (Hide below)

Defines those physical and chemical properties that are relevant to the material characterization of graphites used in the semiconductor industry. Does not incorporate any application performance standards relative to semiconductor graphites.

General Product Information - (Show below) - (Hide below)

Document Type	Standard
ISBN
Pages
Published
Publisher	National Electrical Manufacturers Association
Status	Withdrawn

Standards Referencing This Book - (Show below) - (Hide below)

ASTM E 228 : 2017 : REDLINE	Standard Test Method for Linear Thermal Expansion of Solid Materials With a Push-Rod Dilatometer
NEMA CB 1:2000 (R2012)	Brushes for Electrical Machines
ASTM C 561 : 2016 : REDLINE	Standard Test Method for Ash in a Graphite Sample
ASTM C 559 : 2016 : REDLINE	Standard Test Method for Bulk Density by Physical Measurements of Manufactured Carbon and Graphite Articles

Categories associated with this Standard - (Show below) - (Hide below)

Sub-Categories associated with this Standard - (Show below) - (Hide below)

Sorry this product is not available in your region.

Add To Cart