NEN 10747-10 : 1997 AMD 3 1997
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SEMICONDUCTOR DEVICES - PART 10: GENERIC SPECIFICATIONS FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS
Published date
12-01-2013
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Defines general procedures for quality assessment to be used in the IEQO System and gives general rules for: measurement methods of electrical characteristics; climatic and mechanical tests; endurance tests.
| DevelopmentNote |
AMD 3 Supersedes AMD 1 & AMD 2 on 28/03/2007. (07/2009)
|
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60747-10:1991 | Identical |
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