NEN 10747-10 : 1997 AMD 3 1997
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - PART 10: GENERIC SPECIFICATIONS FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS
Published date
12-01-2013
Publisher
Sorry this product is not available in your region.
Defines general procedures for quality assessment to be used in the IEQO System and gives general rules for: measurement methods of electrical characteristics; climatic and mechanical tests; endurance tests.
| DevelopmentNote |
AMD 3 Supersedes AMD 1 & AMD 2 on 28/03/2007. (07/2009)
|
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60747-10:1991 | Identical |
Summarise
Access your standards online with a subscription
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.
Sorry this product is not available in your region.