NEN 10747-11 : 1986 AMD 2 1997
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - PART 11: SECTIONAL SPECIFICATION FOR DISCRETE DEVICES
Published date
12-01-2013
Publisher
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Gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, tests and measurement procedures required for the assessment of semiconductor devices.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60747-11:1985 | Identical |
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