NEN 11580 : 1995
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The latest, up-to-date edition.
MEASUREMENT OF RETURN LOSS ON WAVEGUIDE AND WAVEGUIDE ASSEMBLIES
Published date
12-01-2013
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Relates with the sweep frequency method used for the measurement of return loss on waveguide and waveguide assemblies. Fundamentally the method involves measuring the amplitude of the reflected wave at the waveguide under test (WUT) input by means of a reflectometer device.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 61580:1995 | Identical |
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