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NEN 11580-9 : 1996

Current

Current

The latest, up-to-date edition.

METHODS OF MEASUREMENT FOR WAVEGUIDES - PART 9: REFLECTION COEFFICIENT AT RECTANGULAR WAVEGUIDE INTERFACES

Published date

12-01-2013

Determines the reflection coefficient at the junction of two similar rectangular waveguides due to the following imperfections: a) differences in the waveguide internal dimensions; b) lateral displacement between the waveguide axes in either the H or E plane; c) angular misalignment between the waveguide axes.

DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current

Standards Relationship
IEC 61580-9:1996 Identical

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