NEN EN 12698-2 : 2007
Current
The latest, up-to-date edition.
CHEMICAL ANALYSIS OF NITRIDE BONDED SILICON CARBIDE REFRACTORIES - PART 2: XRD METHODS
12-01-2013
Foreword
1 Scope
2 Normative references
3 Definitions
4 Apparatus
5 Sampling
6 Procedure
6.1 Sample preparation
6.2 Measuring parameters
6.3 Qualitative analysis
6.4 Quantitative analysis
7 Precision
7.1 Repeatability
7.2 Reproducibility
8 Test report
Annex A (normative) X-ray diffraction data for the
determination of beta -SiAION content
A.1 General
A.2 Example of calculation of z-value for beta -SiAION
Bibliography
Specifies methods for the determination of mineralogical phases typically apparent in nitride and oxy-nitride bonded silicon carbide refractory products using a Bragg-Brentano diffractometer.
| DevelopmentNote |
Supersedes NEN EN 12698. (05/2007)
|
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| UNE-EN 12698-2:2007 | Identical |
| UNI EN 12698-2 : 2007 | Identical |
| EN 12698-2:2007 | Identical |
| BS EN 12698-2:2007 | Identical |
| DIN EN 12698-2:2007-06 | Identical |
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