NEN EN 13925-1 : 2003
Current
The latest, up-to-date edition.
NON-DESTRUCTIVE TESTING - X-RAY DIFFRACTION FROM POLYCRYSTALLINE AND AMORPHOUS MATERIAL - PART 1: GENERAL PRINCIPLES
12-01-2013
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 General principles of X-ray powder diffraction (XRPD)
5 Meaning of the word 'powder' in terms of X-ray diffraction
6 Characteristics of powder diffraction line profiles
7 Type of analysis
7.1 General
7.2 Phase identification (also referred to as 'Qualitative
phase analysis')
7.3 Quantitative phase analysis
7.4 Estimation of the crystalline and amorphous fractions
7.5 Determination of lattice parameters
7.6 Determination of crystal structures
7.7 Refinement of crystal structures
7.8 Characterisation of crystallographic texture
7.9 Macrostress determination
7.10 Analysis of crystalline size and microstrain
7.10.1 General
7.10.2 Determination of crystallite size (size of
coherently scattering domains)
7.10.3 Determination of microstrains
7.11 Electron radial distribution function
8 Special experimental conditions
Annex A (informative) Relationships between the XRPD standards
Bibliography
Specifies the general principles of X-ray diffraction from polycrystalline and amorphous materials.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| UNI EN 13925-1 : 2006 | Identical |
| EN 13925-1:2003 | Identical |
| DIN EN 13925-1:2003-07 | Identical |
| BS EN 13925-1:2003 | Identical |
| UNE-EN 13925-1:2006 | Identical |
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