NEN EN 140401-803 : 2007 AMD 3 2017

1 Characteristics and ratings
  1.1 Dimensions and ratings
  1.2 Derating curve
  1.3 Resistance range and tolerance on rated resistance
  1.4 Variation of resistance with temperature and temperature
      rise
  1.5 Climatic categories
  1.6 Limits for change of resistance at tests
  1.7 Non-linear properties
  1.8 Marking, packaging and ordering designation
      1.8.1 Component
      1.8.2 Package
      1.8.3 Packaging/Taping
      1.8.4 Ordering information
  1.9 Additional information (not for inspection purpose)
      1.9.1 Storage
      1.9.2 Mounting
      1.9.3 Soldering process
      1.9.4 Conductive glueing
      1.9.5 Use of cleaning solvents
      1.9.6 Pulse load capability
      1.9.7 Variation of resistance value (drift) for lifetimes
            up to 200 000 h
      1.9.8 Dissipation notes
      1.9.9 Current noise
2 Quality assessment procedures
  2.1 General
      2.1.1 Zero defect approach
      2.1.2 100% - Test
      2.1.3 0 Ohm - Resistor
      2.1.4 Certificate of Conformity (CoC)
      2.1.5 Certified test records
      2.1.6 Failure rate level (only version E)
  2.2 Qualification approval
      2.2.1 Version A
      2.2.2 Version E
  2.3 Quality conformance specification
      2.3.1 Qualification approval according to EN 100114-2
      2.3.2 Technology approval according to EN 100114-6
      2.3.3 Non-conforming items
Annex A (normative) Fixed sample size Qualification Approval
        and Quality Conformance Inspection test schedule
        for fixed low power surface mounting (SMD) resistors
Annex B (informative) Letter symbols and abbreviations
Annex C (informative) Standards referred to in this specification

Specifies various parameters of electronic components of assessed quality in accordance with: EN 60115-1:2001 + A1:2001, EN 140400:2003 and EN 140401:2002.