NEN EN 140401-804 : 2011 AMD 1 2013

1 Characteristics and ratings
  1.1 Dimensions and Ratings
  1.2 Derating curve
  1.3 Resistance range and tolerance on rated resistance
  1.4 Variation of resistance with temperature and temperature
       rise
  1.5 Climatic categories
  1.6 Limits for change of resistance at tests
  1.7 Non-linear properties
  1.8 Marking, packaging and ordering designation
       1.8.1 Component
       1.8.2 Package
       1.8.3 Packaging/Taping
       1.8.4 Ordering information
  1.9 Additional information (not for inspection purpose)
       1.9.1 Storage
       1.9.2 Mounting
       1.9.3 Soldering process
       1.9.4 Conductive gluing
       1.9.5 Use of cleaning solvents
       1.9.6 Pulse load capability
       1.9.7 Variation of resistance value (drift) for
             lifetimes up to 200000 h
       1.9.8 Dissipation notes
       1.9.9 Current noise
2 Quality assessment procedures
  2.1 General
       2.1.1 Zero defect approach
       2.1.2 100 %-Test
       2.1.3 0 ohm-Resistor
       2.1.4 Certificate of Conformity (CoC)
       2.1.5 Certified test records
       2.1.6 Failure rate level (only version E)
  2.2 Qualification Approval
       2.2.1 Version A
       2.2.2 Version E
  2.3 Quality conformance inspection
       2.3.1 Qualification approval according to EN 100114-2
       2.3.2 Technology approval according to EN 100114-6
       2.3.3 Non-conforming items
Annex A (normative) - Fixed sample size Qualification Approval
        and Quality Conformance Inspection test schedule for
        fixed low power surface mount (SMD) resistors
Annex B (informative) - Letter symbols and abbreviations
Annex C (normative) - Standards referred to in this specification