NEN EN 143000 : 2005

Foreword
Preface
Section 1 - Scope
1. Scope
Section 2 - General
2.1 Related documents
2.2 Units, symbols and terminology
2.3 Preferred values
2.4 Marking
Section 3 - Quality assessment procedures
3.1 Primary stage of manufacture
3.2 Structurally similar parts
3.3 Qualification approval procedures
3.4 Certified test records
3.5 Delayed delivery
3.6 Alternative test methods
3.7 Release for delivery before the completion of
      Group B tests
3.8 Formation of inspection lots
Section 4 - Test and measurement procedures
4.1 Standard conditions for testing
4.2 Drying and recovery
4.3 Visual inspection and check of dimensions
4.4 Zero-power resistance
4.5 B-value or resistance ratio
4.6 Insulation resistance
4.7 Voltage proof
4.8 Resistance/temperature characteristic
4.9 Dissipation factor (delta)
4.10 Thermal time constant by cooling (tau c)
4.11 Thermal time constant by ambient change (tau a)
4.12 Robustness of terminations
4.13 Soldering
4.14 Rapid change of temperature
4.15 Vibration
4.16 Bump
4.17 Shock
4.18 Climatic sequence
4.19 Damp heat, steady state
4.20 Endurance
Section 5 - Blank detail specification
Appendices
A. Fixed sample size test schedule for qualification
      approval
B.1 Preferred mounting for thermistors without wire
      termination
B.2 Preferred mounting for thermistors with wire
      termination
Note: A 'side-line' in the left hand margin of this
      document indicates that the text deviates from
      that in the relevant IEC documents
Figures
1. Dissipation factor measuring circuit
2. Thermal time constant measuring circuit

Describes terms and methods of test applicable to directly heated thermistors, insulated and non-insulated types with negative temperature coefficients (NTC-D).