NEN EN 165000-4 : 1996
Current
The latest, up-to-date edition.
FILM AND HYBRID INTEGRATED CIRCUITS - PART 4: CUSTOMER INFORMATION, PRODUCT ASSESSMENT LEVEL SCHEDULES AND BLANK DETAIL SPECIFICATION
12-01-2013
1 Introduction
1.1 How EN 165000 works
1.2 Customer/manufacturer interface
1.3 The product assessment level schedules
1.3.1 Derivation of the product assessment level
schedules
1.3.2 Indication of applications for the product
assessment level schedules
1.4 Test requirements of the PALS and their
applicability to real life application
1.4.1 The origin of the inspection requirements
1.4.2 Electrical tests
1.4.3 Other screening tests
1.4.4 Device sample testing
1.4.5 Design evaluation testing
1.4.6 AQLs, inspection levels and sampling plans
2 Product assessment level schedules and detail
specifications
PALS 1-11
3 Blank detail specification requirements
Front page for standard catalogue circuits
Front page for customer circuits
Section one - general data
Section two - inspection requirements
Example of a customer detail specification
Tables
1 PALS for solder or chip & wire (non-hermetic)
assembly
2 PALS for chip and wire (hermetic) assembly
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 165000-4:1996-11 | Identical |
| I.S. EN 165000-4:1998 | Identical |
| EN 165000-4:1996 | Identical |
| BS EN 165000-4:1996 | Identical |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.