NEN EN IEC 60444-2 : 1997
Current
Current
The latest, up-to-date edition.
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK - PHASE OFFSET METHOD FOR MEASUREMENT OF MOTIONAL CAPACITANCE OF QUARTZ CRYSTAL UNITS
Published date
12-01-2013
Publisher
Defines method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.
| DevelopmentNote |
Supersedes NEN 10444-2 (07/2002)
|
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN 60444-2:1997 | Identical |
| IEC 60444-2:1980 | Identical |
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