![header thumbnail](/images/publishers\nen_cover.gif)
NEN EN IEC 60444-3 : 1997
Current
The latest, up-to-date edition.
![header thumbnail](/images/publishers\nen_cover.gif)
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK - BASIC METHOD FOR THE MEASUREMENT OF TWO-TERMINAL PARAMETERS OF QUARTZ CRYSTAL UNITS UP TO 200 MHZ BY PHASE TECHNIQUE IN A PI-NETWORK WITH COMPENSATION OF THE PARALLEL CAPACITANCE
12-01-2013
Defines method for the measurement of the parameters of quartz crystal units using a inductance to compensate for the effects of C<(inf)0> at the frequency of the crystal unit with accuracy depending on the type of crystals for: a) frequency with a fractional accuracy ranging between 10-<(sup)6> and 10-<(sup)8>; b) resistance with a fractional accuracy ranging between 2% and 5%; c) motional capacitance and motional inductance with a fractional accuracy ranging between 3% and 7%.
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.