NEN EN IEC 60444-3 : 1997
Current
The latest, up-to-date edition.
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK - BASIC METHOD FOR THE MEASUREMENT OF TWO-TERMINAL PARAMETERS OF QUARTZ CRYSTAL UNITS UP TO 200 MHZ BY PHASE TECHNIQUE IN A PI-NETWORK WITH COMPENSATION OF THE PARALLEL CAPACITANCE
12-01-2013
Defines method for the measurement of the parameters of quartz crystal units using a inductance to compensate for the effects of C<(inf)0> at the frequency of the crystal unit with accuracy depending on the type of crystals for: a) frequency with a fractional accuracy ranging between 10-<(sup)6> and 10-<(sup)8>; b) resistance with a fractional accuracy ranging between 2% and 5%; c) motional capacitance and motional inductance with a fractional accuracy ranging between 3% and 7%.
| DevelopmentNote |
Supersedes NEN 10444-3 (07/2002)
|
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN 60444-3:1997 | Identical |
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