NEN EN IEC 60749-13 : 2002
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE
Published date
12-01-2013
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Defines a salt atmosphere test that determines the resistance of semiconductor devices to corrosion.
| DevelopmentNote |
Supersedes NEN EN IEC 60749. (09/2011)
|
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-13:2002 | Identical |
| EN 60749-13:2002 | Identical |
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