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NEN-EN-IEC 60749-17:2019

Current

Current

The latest, up-to-date edition.

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

Available format(s)

Hardcopy

Language(s)

English

Published date

01-05-2019

€43.48
Excluding VAT

The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. 

Committee
TC 47
DocumentType
Standard
Pages
0
PublisherName
Netherlands Standards
Status
Current
Supersedes

Standards Relationship
EN IEC 60749-17:2019 Identical
IEC 60749-17:2019 Identical

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