NEN EN IEC 60749-18 : 2019
Current
Current
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Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
Published date
01-06-2019
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This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source.
| Committee |
TC 47
|
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-18:2019 | Identical |
| EN IEC 60749-18:2019 | Identical |
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