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NEN EN IEC 60749-27 : 2007 AMD 1 2012

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)

Published date

12-01-2013

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Defines a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD).

DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current

Standards Relationship
EN 60749-27:2006/A1:2012 Identical
IEC 60749-27:2006+AMD1:2012 CSV Identical

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