NEN EN IEC 60749-29 : 2011
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 29: LATCH-UP TEST
Published date
12-01-2013
Publisher
Sorry this product is not available in your region.
Defines the I-test and the overvoltage latch-up testing of integrated circuits. Also defines a method for determining integrated circuit (IC) latchup characteristics and specifies latch-up failure criteria.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| EN 60749-29:2011 | Identical |
| IEC 60749-29:2011 | Identical |
Summarise
Sorry this product is not available in your region.