NEN EN IEC 60749-38 : 2008
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 38: SOFT ERROR TEST METHOD FOR SEMICONDUCTOR DEVICES WITH MEMORY
Published date
12-01-2013
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Defines a procedure for measuring the soft error susceptibility of semiconductor devices with memory when subjected to energetic particles such as alpha radiation.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-38:2008 | Identical |
| EN 60749-38:2008 | Identical |
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