NEN EN IEC 60749-6 : 2017
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 6: STORAGE AT HIGH TEMPERATURE
Published date
12-01-2013
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Defines the effect on all solid state electronic devices of storage at elevated temperature without electrical stress applied.
| DevelopmentNote |
Supersedes NEN EN IEC 60749. (09/2011)
|
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-6:2017 | Identical |
| EN 60749-6:2017 | Identical |
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