NEN EN IEC 61000-4-34 : 2007 AMD 1 2009
Current
Current
The latest, up-to-date edition.
ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-34: TESTING AND MEASUREMENT TECHNIQUES - VOLTAGE DIPS, SHORT INTERRUPTIONS AND VOLTAGE VARIATIONS IMMUNITY TESTS FOR EQUIPMENT WITH MAINS CURRENT MORE THAN 16 A PER PHASE
Published date
12-01-2013
Publisher
Sorry this product is not available in your region.
Defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. Applies to electrical and electronic equipment having a rated input current exceeding 16 A per phase.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| EN 61000-4-34:2007/A1:2009 | Identical |
| IEC 61000-4-34:2005+AMD1:2009 CSV | Identical |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.