NEN EN IEC 61163-1 : 2007
Current
Current
The latest, up-to-date edition.
RELIABILITY STRESS SCREENING - PART 1: REPAIRABLE STRESS SCREENING IN LOTS
Published date
12-01-2013
Publisher
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Explains particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an unacceptably low reliability in the early failure period, and when other methods, such as reliability growth programmes and quality control techniques, are not applicable.
| DevelopmentNote |
Supersedes NEN IEC 61163-1 and NEN 11163-1. (01/2008)
|
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
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| Supersedes |
| Standards | Relationship |
| EN 61163-1 : 2006 | Identical |
| IEC 61163-1:2006 | Identical |
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