NEN EN IEC 61747-6-3 : 2011
Current
Current
The latest, up-to-date edition.
LIQUID CRYSTAL DISPLAY DEVICES - PART 6-3: MEASURING METHODS FOR LIQUID CRYSTAL DISPLAY MODULES - MOTION ARTIFACT MEASUREMENT OF ACTIVE MATRIX LIQUID CRYSTAL DISPLAY MODULES
Published date
12-01-2013
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Specifies general procedures for quality assessment related to the motion performance of LCDs. Also defines artifacts in the motion contents and methods for motion artifact measurement. Pertains to transmissive type active matrix liquid crystal displays.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 61747-6-3:2011 | Identical |
| EN 61747-6-3 : 2011 | Identical |
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